Seminar by Dr. Pankaj Jalote
Reliability Growth in Software Products
Dr Pankaj Jalote
Department of Computer Science and Engineering
Indian Institute of Technology Kanpur
Date: Tue, Jan 28, 2005
Time: 3:45 PM
Venue: CS-101
Abstract
Most of the software reliability growth models work under the assumption that reliability of software grows due to the bugs that cause failures being removed from the software. While correcting bugs will improve reliability, another phenomenon has often been observed. The failure rate of a software product, as observed by the user, improves with time irrespective of whether bugs are corrected or not. Consequently, the reliability of a product, as observed by users, varies, depending on the length of time they have been using the product. In this talk we discuss explanations of this phenomenon and present a simple model to represent this phenomenon. The talk provides a number of examples where this model has been applied to data captured from released products from Microsoft.
About the Speaker
Pankaj Jalote is Professor in the Department of Computer Science and Engineering at the Indian Institute of Technology Kanpur, India. He did his B.Tech. from IIT Kanpur, MS from Pennsylvania State University, and Ph.D. from University of Illinois at Urbana-Champaign. From 1985 to 1989 he was an Assistant Professor at University of Maryland at College Park. Since 1989 he is at IIT Kanpur, where he was also the Head of the CSE Department from 1998 to 2002. From 1996 to 1998, he was Vice President (quality) at Infosys Technologies Ltd., a large Bangalore-based software house, and 2003-2004 was a Visiting Researcher at Microsoft Corporation, Redmond, USA. He is the author of four books including the highly acclaimed CMM in Practice, which has been translated in Chinese, Japanese, Korean, etc, and the best selling text book An Integrated Approach to Software Engineering, (Springer Verlag, 2nd Edition, 1997). His main area of interest is Software Engineering. He is on the board of IEEE Transactions on Software Engineering and is Fellow of the IEEE.